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Products Overview

A8-16


atg lm logo web 278x300High throughout Flying Probe Test System for Production Panel and Complex Server Boards

Universal shuttle system with clamp and stretch mode for testing flexible and rigid boards. Pneumatic clamping function controlled by foot switch. The test heads of an A8-16 are smaller than of an A7. The system provides therefore more heads per test area than an  A7. This means higher speed and throughput. With the A8-16 you shift the economical break-even point towards high quantities.

 

KEY FEATURES

  • High throughput test system for production panel and complex server boards
  • 16 test heads
  • Test area 24" x 24.4" (610mm x 620mm)
  • Tension option for flexible boards 

MACHINE FEATURES


MECHANICS

A8 Plus

  • Max. Panelsize: 610mm x 640mm (24" x 25.2")
  • Min. Panelsize: 10mm x 10mm (0.4" x 0.4")
  • Test area: 610mm x 620mm (24” x 24.4”)
  • Board thickness: up to 10mm (0.4")
  • Smallest Pad size: 35µm (1.4 mil) special setup
  • Smallest Pitch: 80µm (3.2 mil)
  • 16 Test heads (8 top / 8 bottom)
  • 8 high resolution Color Camera's (4 top / 4 bottom) - Resolution 9µm pixel
  • Resolution measurement system: ± 1µm (± 0.04mil)
  • Repeatable accuracy: ± 4µm (± 0.16mil)
  • Soft Touch Probes pressure: 5g to 10g 
  • Micro Needle Probes pressure: 0.3g to 2.5g


ELECTRONICS

  • Continuity test: 1Ω - 10kΩ
  • Isolation test:
    • Up to 25MΩ (FM)
    • Up to 100GΩ (Ohmic)
    • MicroShort Detection® 
  • Test voltage: 100mV to 1000V


GENERAL CONNECTIONS

  • Data input format: IPC-D-356A
  • Network connection: Ethernet, TCP/IP
  • Power Supply: 230V, 50Hz (115V, 60Hz), 1500VA
  • Compressed air: 8 bar /115 psi filtered
  • Temperature: 18°C to 27°C /66°F to 81°F, ±3K
  • Relative humidity: 40% to 60%
  • Machine weight: 1100kg

OPTIONS 

  • 4-wire Kelvin measurement with max. 300mA test current:
    • 0Ω to 1kΩ - Tolerance ± 2%, min. ± 25µΩ
    • With Kelvin probes contact pressure 0.3g to 2.5g
    • Smallest pad: 80µm (3.2 mil)*
    • Smallest pitch: 120µm (4.8 mil)*
      • *with Kelvin probe fine adjustment
  • Embedded Component test:
    • R 0Ω - 1MΩ - Tolerance ± 1%, min. ± 0.5Ω | 1MΩ - 200MΩ - Tolerance ± 3%
    • C 0F - 100µF - Tolerance ± 2%, min. ± 30fF
    • L 0H - 10mH - Tolerance ± 5%, min. ± 0.25µH
  • Diode/Varistor:  UF,UR, UBR 0V to 12.5V 
  • LaTest® open detection:
    • With LaTest® probes - 1g to 10g
    • High current - 1.4a (1 Khz)
  • Retest of fault files from external grid test systems on inquiry
  • Repair software with barcode support 

RELATED PRODUCTS 

a5-neo a7    a7-16   a7-XW  a8-plus

 

 

All information subject to change without notice!

For more information, visit the website or send us your information request.