Prototype and low volume Flying Probe Test System 

The A5 Neo combines an affordable technology with all of the enhanced measurement methods of probe systems. Universal shuttle system with clamp and stretch mode for testing flexible and rigid boards.

It can be deployed for a quick standard Electrical Test or if necessary be equipped with the latest test functions to achieve the highest test specifications available on the market.
This product has 8 high speed test heads (4 Top, 4 Bottom) equipped with 4 cameras for extremely fast and intelligent board scanning. It can perform High Voltage testing of up to 1000 Volts (standard up to 500 Volts).

---

KEY FEATURES

• Economical test system with step motor drive technology
• 8 test heads
• Pneumatic tension shuttle for flexible and thin boards
• Test area 24" x 18" (610mm x 460mm) 

---

MACHINE FEATURES

MECHANICS

• Max. Panelsize: 640mm x 495mm (25.2" x 19.5")
• Min Panelsize: 10mm x 10mm (0.4" x 0.4")
• Test area: 610mm x 460mm (24" x 18.1" )
• Board thickness: up to 8mm (0.32")
• 8 Test heads (4 top / 4 bottom)
• 4 Camera's (2 top / 2 bottom)
• Smallest Pad: 50µm (2.0 mil with Softouch Probes)
• Smallest Pitch: 100µm (4 mil)
• Resolution measurement system: ± 0.1µm (± 0.004 mil)
• Repeatable accuracy ± 5µm (± 0.2 mil)
• Soft Touch Probes pressure: 5g to 10g
• Standard Probes pressure: 20g to 100g
  
  

ELECTRONICS

• Continuity test: 1Ω - 10kΩ
• Isolation test:
  • Up to 25MΩ (FM)
  • Up to 100GΩ (Ohmic)
  • MicroShort Detection®
• Test voltage: 100mV to 1000V 

GENERAL CONNECTIONS

• Data input format: IPC-D-356A
• Network connection: Ethernet, TCP/IP
• Power Supply: 230V, 50Hz (115V, 60Hz), 900VA
• Temperature: 18°C to 27°C /66°F to 81°F, ±3K
• Relative humidity: 40% to 60%
• Machine weight: 700kg

---

OPTIONS 

• 4-wire Kelvin measurement with max. 90mA test current:
  
  • 0Ω to 1kΩ - Tolerance ± 2%, min. ± 25µΩ
  • with Kelvin probes contact pressure 0.3g to 2.5g
  • Smallest pad: 100µm (4.0 mil)*
  • Smallest pitch: 150µm (6.0 mil)*
  *with Kelvin probe fine adjustment
• Embedded Component test:
  • R 0Ω - 1MΩ - Tolerance ± 1%, min. ± 0.5Ω | 1MΩ - 200MΩ - Tolerance ± 3%
  • C 0F - 100µF - Tolerance ± 2%, min. ± 30fF
  • L 0H to 10mH - Tolerance ± 5%, min. ± 0.25µH
• Diode/Varistor:  U_F,U_R, U_BR 0V to 12.5V 
• LaTest® open detection:
  • With LaTest® probes - 1g to 10g
  • High current - 1.4a (1 Khz)
• Retest of fault files from external grid test systems on inquiry
• Repair software with barcode support

---

RELATED PRODUCTS 

         

 

 

---

All information subject to change without notice!

For more information, visit the website or send us your information request.