Overview of Substrate Flying Probe Test Systems 
Substrates with structures down to 10µm and several hundred thousand test points per panel require specific solutions for
- scanning
- capacitance measurement
- high accuracy and temperature Management
S2 Plus - Developed for HDI & Substrate Products
S2-16 Plus - Developed for HDI & Substrate Products
S3 - High End Substrate Flying Probe Test System
S3-8 - High Speed - High End Substrate Flying Probe Test System
All information subject to change without notice!
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