2D metrology is CIMS technology for accurate measurements taken on the surface of a PCB. 2D metrology options are integrated with CIMS AOI systems becoming a part of inspection cycle, eliminating the need for a separate process.

CIMS offers two types of 2D metrology:

+2CD: real time micro-measurements of individual PCB elements, such as traces or pads, with up to ±3 micron accuracy (subject to surface condition). The measurements can be taken manually or automatically in pre-defined locations such as coupons or individual circuit elements.

+2DM: AOI integrated macro-measurements of an entire panel in order to determine any dimensions violation. This option is used to automatically calculate stretch factor by measuring distances between targets in each corner of a panel. The measurement can be taken manually or automatically after each scan.

Highlights

• Integration with CIMS AOI systems
• Eliminates external measurement process
• Fast and reliable
• Provides immediate feedback and live alerts
• Data collection and output option
• Pre-programmed offline
• Automatic measurements of line’s top and bottom width

 Optional Features

• Each 2D option are supplied separate or as a bundle
• Can be bundled with 3D measurement capabilities
• CDB/CDBIC connectivity – defects classification and virtual defects mapping
• Data output options

All information subject to change without notice!