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Phoenix Large Table

CIMS 2 2018AOI for large panel inspection with min line/space down to 40 µm.

Phoenix LT, CIMS latest generation of AOI system, is designed for inspection of large panel of up to 914 mm x 1,067 mm( 36″ x 42″). It is capable to scan down to 40 µm line/space width technology.

The system’s state of the art optical technology Microlight™ is specifically designed and calibrated to achieve optimal image acquisition of laser drills both before and after plating as well as conformal mask applications. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix LT 8pngPhoenix LT is powered by Spark™ – an innovative cross-platform detection engine.

Basic functionalities include

  • Multi-Step and Multi-Zone for best detection policy set-up per zone
  • Micro Inspection and metrology engine
  • Fully automated set-up
  • Variable continuous resolution defined automatically
  • Cad Analyzer creates best reference for detection
  • Dynamic Job enabling operators to instantly change:
    • resolution, steps, parameters on the AOI
  • Filtering system – Inspection results can be re-processed on AOI / CVR and present defects immediately after filtering
  • Full automatic (BLACK BOX) Data Processing and Preparation from CAM Station

 System highlights

  • New linear motors for smooth & silent motion
  • Robust structure
  • Automated vacuum table
  • Microlight illumination
  • 64 bit based firmware
  • Powerful processors to handle high density PCB
  • Compatible with front or back L/U automation
  • Simple and quick setting for new jobs

Optional Features

  • Fi - Final inspection of finished bare boards
  • +2DM metrology - panel dimensions measurement
  • +2CD metrology - 2D measurments of circuit elements
  • LDI - laser drill inspection
  • CDB/CDBIC - defects classification and virtual defects mapping
  • VVS - virtual verification system

   microlight spark

 

 

All information subject to change without notice!