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Products Overview

Phoenix LV

CIMS 2 2018AOI for laser via inspection with min diameter down to 30 µm.

Phoenix LV, CIMS latest generation of AOI system, is designed to support inspection of laser via in high volume manufacturing of HDI or IC Substrates. It is capable to scan via holes down to 30 µm in diameter.

The system’s state of the art optical technology Microlight™ is specifically designed and calibrated to achieve optimal image acquisition of laser drills both before and after plating as well as conformal mask applications. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix LV 8pngPhoenix LV is powered by Spark™ – an innovative cross-platform detection engine.

Basic functionalities include

  • Multi-Step and Multi-Zone for best detection policy set-up per zone
  • Micro Inspection and metrology engine
  • Fully automated set-up
  • Variable continuous resolution defined automatically
  • Cad Analyzer creates best reference for detection
  • Dynamic Job enabling operators to instantly change:
    • resolution, steps, parameters on the AOI
  • Filtering system – Inspection results can be re-processed on AOI / CVR and present defects immediately after filtering
  • Full automatic (BLACK BOX) Data Processing and Preparation from CAM Station

 System highlights

  • New linear motors for smooth & silent motion
  • Robust structure
  • Automated vacuum table
  • Microlight illumination
  • 64 bit based firmware
  • Powerful processors to handle high density PCB
  • Compatible with front or back L/U automation
  • Simple and quick setting for new jobs

Optional Features

  • +2DM metrology - panel dimensions measurement
  • +2CD metrology - 2D measurments of circuit elements
  • +3DP metrology - 3D profiling of circuit element
  • CDB/CDBIC - defects classification and virtual defects mapping
  • VVS - virtual verification system

   microlight spark

 

 

All information subject to change without notice!