Productivity:
8 test head system with linear drive technology
Stability:
High resolution cameras 3 µm / Px.
Flexibility:
Supports supstrate like PCB (SLP) applications
Description
The A9 Plus is utilizing the same technology as the A9 and is in addition equipped with a temperature control unit and 4 high-resolution cameras. The system provides the accuracy to test reliably pad sizes down to 25 microns and is optimized for the test of Substrate-like-PCBs and similar products.
Key benefits
A9 technology with additional temperature control and high resolution cameras for maximum accuracy;
Camera resolution of 3 micron per pixel compared to 6 micron of the standard A9.
Specifications
8 test heads
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Linear motor drives for X-, phi- and Z-axis
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Granit base
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High-resolution cameras with 3 microns per pixel
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Max. test area
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610 mm x 510 mm (24" x 20") |
Max. product size
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640 mm x 535 mm (25.2" x 21.0") |
Test speed
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up to 220 TP/sec (depending on test method) |
4 high-resolution color XGA-cameras
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Smallest pad/pitch A9
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25 µm*(1 mil) / 50 µm (2 mil) (* glass calibration) |
Soft touch contacting
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Micro short detection (MSD®)
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Pneumatic clamping / tension frame
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Options: Embedded component test, Test floor integration with Universal Grid systems High-speed Kelvin 4-wire test up to 300 mA*, LaTest® (Latent defect)