Productivity:
16 test head system with linear drive technology
Stability:
suitable for oversized PCBs
Flexibility:
Supports Probecard and Backpanel application
Description
The A7 Pro is also available with 16 test heads, benefitting from the same technical improvements as the 8 test head version, providing the same high performance level also for larger test areas.
The system is perfectly suited for the high test point counts of server products or probecard designs.
Key benefits:
16 head test system with large test area of 24" x 39.4" (660x1000mm).
The system combines outstanding test speed and high accuracy. It is our best seller for Probe Cards and Backpanel applications.
Specifications:
16 test heads
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Linear motor drives for X- and Z-axis
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Stepper motor technology for phi-axis
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Max. test area
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610 mm x 1000 mm (24" x 39.4") |
Max. product size
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610 mm x 1050 mm (24" x 41.4") |
Test speed
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up to 260 TP/sec (depending on test method) |
4 high-resolution color XGA-cameras
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Smallest pad size
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50 µm (2 mil) |
Smallest pitch
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100 µm (4 mil) |
Micro short detection (MSD®)
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Pneumatic clamping / tension frame
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Options: Embedded component test, Test floor integration with Universal Grid systems High-speed Kelvin 4-wire test up to 500 mA*, LaTest® (Latent defect) & Backdrill testing